Aec q100 001 pdf

AEC-Q200标准 Q200标准是用于被动器件的，标准全称：Stress Test Qualification For Passive Components，被动器件应力测试认证，这个名字比Q100和101短多了。现在的Rev D版本是2010年的，距今已经十几年了。 Q200除主标准外，还有7个标准，从001到007，分别如下： aec-q100 001 绑线拉力 wbp c2 可焊性 sd c3 k：使用aec-q100-005方法来对独立非易失存储器（nvm）集成电路或带有nvm的集成 所有应力测试前后的电气测试都要在每个器件定义的温度和极限参数范围内进行 附加要求 仅用于表面贴器件 附加要求 esd22-a108 附加要求 附加要求 附加要求 附加要求 附加要求 nvm AEC-Q100-Latch-up: Test per JEDEC JESD78 with the AEC-Q100-004 requirements. 100mA @ 125C TEST @ RH: 6 1: 6 Lot1: 0/6: Performed in KLM ED AEC-Q100-009, Freescale 48A spec Electrical Distribution TEST @ RHC Cpk = or > 1.67 30 0 Pass, performed on 176ld Performed on 176ld 212552: Spectrum 2M25V 176ld 0/30 FG AEC-Q100-007 Fault Grading FG shall AEC-Q100#A1 JESD22A113 231 X 3lots 0 fail Level 3. Prior to TCT, PCT, THB. F/T check before and after at room temp. Delam. on die surface is acceptable if can pass subsequent tests. TCT (temp cycling) AEC-Q100#A4 JESD22A104 77 X 3 lots 0 fail Grade 1 : -65~150℃, 500 cycles. (Or equivalent - 55~125℃, 1000 cycles) ELECTRICAL DISTRIBUTIONS ASSESSMENT, AEC-Q100-009B Datasheet, AEC-Q100-009B circuit, AEC-Q100-009B data sheet : ETC1, alldatasheet, Datasheet, Datasheet search site for Electronic Components and Semiconductors, integrated circuits, diodes, triacs and other semiconductors. aec-q100是汽车集成电路（ic）的重要应力测试标准。由aiag汽车组织开发的用于集成电路的资格认证测试流程。包括了一系列应力测试失效机理、最低应力测试认证要求的定义及集成电路认证的参考测试条件。这些测试能够模拟跌落半导体器件和封装失效，目的是能够相对于一般条件加速跌落失效。 AEC_Q100_Rev_G_Image_Marked资料.pdf,AEC - Q100 - Rev-G May 14, 2007 FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS Automotive Electronics Council Component Technical Committee AEC - Q100 - REV-G May 14, 2007 Automotive Electronics Council Component Technical This Reliability test of automotive IC is mostly based on the AEC-Q100 (for IC chip), AEC-Q101 (for discrete components), AEC-Q102(Discrete Optoelectronic), AEC-Q104(Multichip Module) and AEC-Q200 (for passive components) specifications from the Automotive Electronics Council (AEC). Though featuring stricter test conditions than consumer IC specification, they are JEDEC or MIL-STD centered AEC-Q100 是基于集成电路应力测试认证的失效机理的标准，它包含以下12个测试方法： ¶ AEC-Q100-001 邦线切应力测试 ¶ AEC-Q100-002 人体模式静电放电测试 ¶ AEC-Q100-003 机械模式静电放电测试 ¶ AEC-Q100-004 集成电路闩锁效应测试 ¶ AEC-Q100-005 可写可擦除的永久性记忆的 1.3.1 aec q100 认证 如果成功完成根据本文件各要点需要的测试结果，那么将允许供应 商声称他们的零件通过了 aec q100 认证。供应商可以与客户协商，可 以在样品尺寸和条件的认证上比文件要求的要放宽些，但是只有完成要 求实现的时候才能认为零件通过了 aec Human body model (HBM), per AEC Q100-002, all pins(1) HBM ESD Classification Level 2 ±2000 V Charged device model (CDM), per AEC Q100-011, all pins CDM ESD Classification Level C6 ±1000 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions Human body model (HBM), per AEC Q100-002, all pins(1) HBM ESD Classification Level 2 ±2000 V Charged device model (CDM), per AEC Q100-011, all pins CDM ESD Classification Level C6 ±1000 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions